Abstract: With the ever increasing development of miniaturization and integration technologies in the microelectronics industry, nanoscale multiferroics have attracted more and more attentions.However, there are still several challenges hinter their applications, especially in nanoscale fabrication and characterization methods. We present a brief overview on the current progress in multiferroic nanodots, covering nano-patterning (including self-assembly, focused ion beam lithography,and anodic aluminium oxide template mask assisted deposition), nanoscale characterization techniques (in particular multifunctional scanning probe microscopy), novel physical properties involved in nanodots, as well as related multiferroic nano/micro-device applications.